Structural Parameters of (Cdse)1-X(Zns)X Mixed Semiconductors


K. Yadaiah1, K. Hadasa, G. Yellaiah1, E. Nagabhushan2 and M. Nagabhushanam3

1Department of Physics, S.V. College, Suryapet - 508 213 (India). 

2Department of Materials Science, University College of Technology, Osmania University, Hyderabad - 500 007 (India).

3Department of Physics, University College of Science, Osmania University, Hyderabad - 500 007 (India). 

 

DOI : http://dx.doi.org/10.13005/msri/060204

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ABSTRACT:

The electrical, photoelectric and other properties of compound semiconductor are highly structure sensitive as they influence the device performance. The structural parameters are strongly dependent on composition and other related properties. In this paper, we report the study of structural parameters of (CdSe)1-x(ZnS)x like crystallinity, crystal phase, lattice constant, average internal stress, strain, grain size etc. XRD, SEM, EDAX techniques were used for the characterization of the compound.

KEYWORDS:

Mixed semiconductors; Co-precipitation; X-ray and optical characterization; Lattice parameters

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Article Publishing History
Received on: 6 July 2006
Accepted on: 30 Sep 2006


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ISSN

Print: 0973-3469, Online: 2394-0565


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